Smaller Footprint, Greater Performance

' StingRay, Compact Raman System '


High-Precision Raman Analysis,

Right on Your Desk

 

StingRay may be compact, but it delivers exceptional Raman performance. With automated measurements, high-resolution spectra, and user-friendly software, it streamlines the workflow making fast, accurate analysis easy, with no complicated setup required.


Feature & Specification



We deliver a user-focused Raman spectroscopy system that ensures ease of use, speed, and precision, through a structurally differentiated design from conventional analytical instruments.


*StingRay integrates the laser, microscope, spectrometer, and automation into one compact, all-in-one system. Its streamlined design makes Raman analysis fast, easy, and accessible for users of all levels.

General Specifications 

Spectral Detector


  • TE-cooled detector
  • Pixel Size 4.54 x 4.54 ㎛.
  • Active pixels 2,749 x 2,119 px
  • Cooling temperature: –15°C 

Motorized xyz stage


  • Travel range: ±10 mm (XY), ±3 mm (Z)
  • Minimum step size: 0.05 µm (XY), 1 µm (Z)
  • Point-by-point mapping supported
     

Laser Module


  • One selectable laser: 405 nm, 488 nm, 532 nm, or 633 nm (other wavelengths available upon request)
  • Precision laser power control via continuous ND filter adjustment

Spectroscopy

 

  • 130 mm focal length, aberration-corrected
  • Spectral resolution :
    <1.3 cm⁻¹ per CCD pixel @ 1200 gr/nm
    <2.5 cm⁻¹ per CCD pixel @ 600 gr/nm

Microscope


  • Objective lenses: 5× to 100× dry type
  • Spatial resolution: <1 µm (XY), axial resolution <2.0 µm @ 100×, N.A. 0.95
  • Uniform illumination through precision optics
  • Equipped with 3M CMOS camera

StingRay Size Specification 

Effortless and Efficient 

Measurement and analysis should be simple and fast. To enhance usability, we’ve separated the measurement and analysis software. All evolving features are provided free of charge to every user. 



Intuitive UI


An easy-to-use interface that feels natural and straightforward, even for first-time users.





Measurement Program (Rays-On)

Fast, accurate measurements with a clean, intuitive interface


  • Designed for ease of use with a simple, clutter-free layout.

  • Quick access to results and smooth integration with the Data Gallery.

  • Easily manage and apply personalized settings for consistent measurement conditions.

        





Analysis Program (WeVu)

Flexible, Independent Analysis on Your Personal PC


  • WeVu runs separately from the measurement program, allowing you to analyze data anytime, directly on your own computer—no equipment needed.

  • Easily access and review measurement data via the Data Gallery.

  • Offers a range of analysis tools with simple, intuitive controls for efficient workflows.





Spectrum Matching Analysis (Optional)

Library-Based Component Identification


  • FAccess a comprehensive library of over 26,000 reference spectra, including data from Sigma-Aldrich covering polymers, minerals, semiconductors, and forensic materials.

  • Makes it easy for users of all levels to quickly identify components and analyze mixtures with confidence.



Contact us for more information and suitability.

We'll talk to you about the right equipment.



Experience with WEVE's solutions. Use Contacts to get in touch anytime.


A. 33, Sagimakgol-ro 62beon-gil, Seongnam-si, Gyeonggi-do, Republic of Korea (13211).


T. 031 548 2990  F. 031 548 2991

M. weve@theweve.com





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